چکیده مقاله
Built in self test BIST is the capability of hardware/software to test by itself BIST techniques are divided into two categories namely offline and online In this paper, a new method based on duplication system test for concurrent online test is presented Analysis of linear feedback shift register LFSR is our main focus to solve challenges and get our objects This Concurrent online method is based on pre computed test set which These efficient vectors are calculated by our own method instead of a deterministic test pattern generation algorithm Area over head is decreased 48 2% compared to the previous methods For large scale circuits this parameter is recorded low percentages In addition to this, getting our test vectors by our own method makes us able to tradeoff between different parameters like fault coverage and area overhead
کلیدواژهها
نویسندگان
Ahmad Menbari
Department of Electrical Engineering, University of Kurdistan, Sanandaj, Iran
Hadi Jahanirad
Department of Electrical Engineering, University of Kurdistan, Sanandaj, Iran
شیوه ارجاع
Menbari, Ahmad and Jahanirad, Hadi,1399,An LFSR based method for concurrent BIST in logic circuits,7th National Congress of New Findings of Iranian Electrical Engineering,Tehran
ارائهشده در
مجموعه مقالات هفتمین کنگره ملی تازه یافته های مهندسی برق ایران20 خرداد 1399 · تهران